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| U. Duerig (1999). "Conservative and Dissipative Interactions
in Dynamic Force Microscopy" in Surface and Interface Analysis, volume 27, (no ), pages 467-73 | Abstract |
| D. Nyfeler (Univ. Bern, Switz.), R. Berger and C. Gerber (1997). "Scanning Force Microscopy on Albite Cleavage Surfaces" in Schweizer Mineral. and Petrolog. Mittelungen, volume 77, (no ), pages 21-6 | Abstract |
| Peter Muller, K. Itaya (1998). "Electrochemical Atomic Force Microscopy On Single-Crystal Bead Facets" in RZ3005 | Abstract and Preprint |
| Peter Muller, K. Itaya (1998). "Electrochemical Atomic Force Microscopy of a Porphin Monolayer" in RZ3007 | Abstract and Preprint |
| U. Duerig , H.R. Steinauer and N. Blanc (1997). "Dynamic force microscopy by means of the
phase-controlled oscillator method" in Journal of Applied Physics, volume 82, (no 8), pages 3641-51 | Abstract |
| R. Berger, Ch. Gerber, H. P. Lang and J. K. Gimzewski (1997). "Micromechanics: A Toolbox for Femtoscale Science: ``Towards a Laboratory on a Tip''" in Microelectronic Engineering, volume 35, (no ), pages 373-9 | Abstract |
| R. Ludeke (2002). "Electrical Characterization of Gate Oxides by Scanning
Probe Microscopies" in Journal of Non-Crystalline Solids, volume 303, (no 1), pages 150-61 | Abstract |
| A. Schirmeisen, G. Cross, A. Stalder, P. Grütter, and U. Dürig (2000). "Metallic Adhesion Forces and Tunneling between
Atomically Defined Tip and Sample" in Applied Surface Science, volume 157, (no ), pages 274-279 | Abstract |
