Home     Products & services     Support & downloads     My account

Select a country   Journals Home     Systems Journal   Journal of Research and Development   ·  Current Issue     ·  Recent Issues     ·  Papers in Progress     ·  Search/Index     ·  Orders     ·  Description     ·  Patents     ·  Recent publications     ·  Author's Guide     Staff     Contact Us     Related links:        IBM Research

Volume 12, Number 2, Page 192 (1968) Nontopical Issue   Full article: PDF   Copyright info     Reflectivity Thickness Corrections for Silicon Dioxide Films on Silicon for VAMFO by W. A. Pliskin, R. A. Wesson Related Subjects: Films; Films, oxide; Instrumentation; Measurement; Optics; Thickness measurement

About IBM | Privacy | Terms of use | Contact