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IBM Journal of Research and Development  
Volume 17, Number 6, Page 509 (1973)
Optical Measurement
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Dimensional Measurement and Defect Detection Using Spatial Filtering

by A. L. Flamholz, H. A. Froot
A new method is described that utilizes coherent bandpass spatial filtering and subsequent superposition to form filtered images in which small differences in size and geometry of the original object are readily detected. The theoretical basis is discussed and experiments described in which signal ratios of about 10:1 are obtained for a diameter change of 2.5 percent of a clear circular disc. The method is used to process in parallel a 57-mm evaporation mask containing 12,000 holes, each being 0.1 mm in diameter. The size of each hole is accurately gauged and small imperfections are indicated in the filtered image.
Related Subjects: Measurement; Optical science and technology