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Volume 52, Number 4/5, Page 493 (2008)
Storage Technologies and Systems |
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Probe-based ultrahigh-density storage technology |
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by A. Pantazi, A. Sebastian, T. A. Antonakopoulos, P. Bächtold, A. R. Bonaccio, J. Bonan, G. Cherubini, M. Despont, R. A. DiPietro, U. Drechsler, U. Dürig, B. Gotsmann, W. Häberle, C. Hagleitner, J. L. Hedrick, D. Jubin, A. Knoll, M. A. Lantz, J. Pentarakis, H. Pozidis, R. C. Pratt, H. Rothuizen, R. Stutz, M. Varsamou, D. Wiesmann, E. Eleftheriou
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Ultrahigh storage densities can be achieved by using a thermomechanical scanning-probe-based data-storage approach to write, read back, and erase data in very thin polymer films. High data rates are achieved by parallel operation of large two-dimensional arrays of cantilevers that can be batch fabricated by silicon-surface micromachining techniques. The very high precision required to navigate the storage medium relative to the array of probes is achieved by microelectromechanical system (MEMS)-based x and y actuators. The ultrahigh storage densities offered by probe-storage devices pose a significant challenge in terms of both control design for nanoscale positioning and read-channel design for reliable signal detection. Moreover, the high parallelism necessitates new dataflow architectures to ensure high performance and reliability of the system. In this paper, we present a small-scale prototype system of a storage device that we built based on scanning-probe technology. Experimental results of multiple sectors, recorded using multiple levers at 840 Gb/in2 and read back without errors, demonstrate the functionality of the prototype system. This is the first time a scanning-probe recording technology has reached this level of technical maturity, demonstrating the joint operation of all building blocks of a storage device. |
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