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Volume 40, Number 1, Page 3 (1996) Terrestrial cosmic rays and soft errors   Full article: HTML PDF   Copyright info     IBM experiments in soft fails in computer electronics (1978-1994) by J. F. Ziegler, H. W. Curtis, H. P. Muhlfeld, C. J. Montrose, B. Chin, M. Nicewicz, C. A. Russell, W. Y. Wang, L. B. Freeman, P. Hosier, L. E. LaFave, J. L. Walsh, J. M. Orro, G. J. Unger, J. M. Ross, T. J. O'Gorman, B. Messina, T. D. Sullivan, A. J. Sykes, H. Yourke, T. A. Enger, V. Tolat, T. S. Scott, A. H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published. Related Subjects: Beams, charged particle; Contamination; Cosmic rays; Manufacturing; Microelectronics; Soft errors; Testing, chip

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