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Zabel, T. H.
Zable, J.
Zable, J. L.
Zachman, J. A.
Zafiropulo, P.
Zaki, O. A.
Zaks, A.
Zamdmer, N.
Zamora, A.
Zapata, I. R.
Zappe, H. H.
Zarkesh-Ha, P.
Zaromb, S.
Zasio, J. J.
Zatti, S.
Zecca, V.
Zee, M.
Zeggert, W. P.
Zeghbroeck, B. J. Van
Zeidner, L.
Zelenski, R. E.
Zemon, S.
Zenewicz, P. P.
Zeng, L.
Zenzo, S. Di
Zhai, B.
Zhai, S.
Zhang, C.
Zhang, G.
Zhang, J.
Zhang, L.
Zhang, L.-J.
Zhang, S.
Zhang, T.
Zhang, Y.
Zhao, P.
Zhao, S. W.
Zhao, Y.
Zheng, G.
Zhestkov, Y.
Zhou, J.
Zhou, M. X.
Zhou, N.
Zhou, R.
Zhou, T.
Zhu, J.
Zhu, Q.
Zhu, W.
Ziegler, J. F.
	IBM Journal of Research and Development 1998	Terrestrial cosmic ray intensities
	IBM Journal of Research and Development 1996	Portable Faraday cup for nonvacuum proton beams
	IBM Journal of Research and Development 1996	Accelerated testing for cosmic soft-error rate
	IBM Journal of Research and Development 1996	Field testing for cosmic ray soft errors in semiconductor memories
	IBM Journal of Research and Development 1996	Terrestrial cosmic rays
	IBM Journal of Research and Development 1996	IBM experiments in soft fails in computer electronics (1978-1994)
	IBM Journal of Research and Development 1996	Preface
	IBM Journal of Research and Development 1972	Nuclear Backscattering Analysis of Nb–Nb2O5–Bi Structure
	IBM Journal of Research and Development 1971	Experimental Evaluation of High Energy Ion Implantation Gradients for Possible Fabrication of a Transistor Pedestal Collector
Ziegler, R. A.
Ziegler,Jr., K.
Zien, J.
Zierak, M. J.
Zier, S. J.
Ziesler, C. H.
Zilles, C.
Zilles, G.
Zilles, S. N.
Zimmermann, V.
Zimmerman, L. L.
Zimmerman, S. M.
Zimmerman, T. G.
Zimowski, M. R.
Zingaretti, D. P.
Zipperer, H.-G.
Ziq, A.
Zitz, J. A.
Ziv, A.
Zloof, M. M.
Zlotek, A.
Zoellin, C. G.
Zollar, Al
Zoric, B. A.
Zubair, M.
Zuchowski, P. S.
Zucker, J.
Zukowski, D. J.
Zuliani, P.
Zumbrunnen, M. L.
Zutic, I.
Zweig, H. J.
Zwick, T.
Zyuban, V.
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, B. M. Kreuz
, C. Berrospi
, C. Supatgiat
, David E. Seeger
, G. M. Swirszcz
, K. Theurich
, M. T. Vaden
, S. R. Carlough

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