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2006	Product-representative “at speed” test structures for CMOS characterization
2005	Design and modeling of equipment used in electrochemical processes for microelectronics
2005	Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection
2005	Low-cost wafer bumping
2001	Modular server frame with robust earthquake retention
1999	Key measurements of ultrathin gate dielectric reliability and in-line monitoring
1999	Sputter deposition for semiconductor manufacturing
1998	Metallization by plating for high-performance multichip modules
1998	Polarographic methods of monitoring addition agents in the electroplating of Sn–Pb solders
1998	Thin-film multichip module packages for high-end IBM servers
1997	Manufacturing with DUV lithography
1996	IBM experiments in soft fails in computer electronics (1978-1994)
1995	Integrated cost and productivity learning in CMOS semiconductor manufacturing
1994	ABC: A better control for manufacturing
1994	Implementation of the PowerPC 601 microprocessor
1993	Architecture and performance of the ESPER-2 hard-disk drive servo writer
1993	Attachment of Solder Ball Connect (SBC) packages to circuit cards
1993	Component procurement and allocation for products assembled to forecast: Risk-pooling effects
1993	Flexible simulation of a complex semiconductor manufacturing line using a rule-based system
1993	Head actuator dynamics of an IBM 5 ¼-inch disk drive
1993	Statistical modeling in manufacturing: Adapting a diagnostic tool to real-time applications
1992	Equipment-related advances in the fabrication of glass-ceramic/copper/polyimide substrates
1992	Integrated processing for microelectronics science and technology
1991	A 128Kb CMOS static random-access memory
1987	Solid modeling for production design
1987	Some aspects of the theory of statistical control schemes
1986	On yield, fault distributions, and clustering of particles
1985	A prototype manufacturing knowledge base in Syllog
1985	Advanced bipolar transistor modeling: Process and device simulation tools for today's technology
1985	An algorithm for carrier routing in a flexible material-handling system
1985	Analysis of manufacturing systems by the Research Queueing Package
1985	Animation and 3D color display of multiple-variable data: Application to semiconductor design
1985	FEDSS—A 2D semiconductor fabrication process simulator
1985	Integrated Manufacturing Modeling System
1985	On the analysis and design of CUSUM-Shewhart control schemes
1985	Scheduling algorithms for flexible flow lines
1985	Semiconductor device simulation using generalized mobility models
1985	Short-term production scheduling of an automated manufacturing facility
1985	The effects of wafer to wafer defect density variations on integrated circuit defect and fault distributions
1985	The generation of three-dimensional bipolar transistor models for circuit analysis
1985	Two-dimensional device simulation program: 2DP
1985	Two-dimensional process modeling: A description of the SAFEPRO program
1985	VLSI wiring capacitance
1984	Preface: Advances in materials and processes for printed circuit packaging technology
1983	A Model for the Prediction of Assembly, Rework, and Test Yields
1983	Computer-Controlled Optical Testing of High-Density Printed-Circuit Boards
1983	Failure Diagnosis on the LT1280
1983	Large Multi-Layer Panel-Drilling System
1983	Multi-Chip Module Test and Diagnostic Methodology
1983	Multi-Layer Ceramics Manufacturing
1983	Precise Numerical Control for the Thermal Conduction Module
1983	Product Quality Level Monitoring and Control for Logic Chips and Modules
1983	Row-by-Row Dynamic Image Analysis of a Matrix of Scanned Points
1983	The LT1280 for Through-the-Pins Testing of the Thermal Conduction Module
1982	Evolution and Accomplishments of VLSI Yield Management at IBM
1982	Feature Size Control in IC Manufacturing
1982	High-Density Board Fabrication Techniques
1982	Immersion Wave Soldering Process
1982	Metrology in Mask Manufacturing
1982	Optimization of Plasma Processing for Silicon-Gate FET Manufacturing Applications
1982	Oxygen Incorporation and Precipitation in Czochralski-Grown Silicon
1982	Plant Automation in a Structured Distributed System Environment
1982	Process Control of the Chlorobenzene Single-Step Liftoff Process with a Diazo-Type Resist
1982	Quality and Reliability Assurance Systems in IBM Semiconductor Manufacturing
1982	Semiconductor Final Test Logistics and Product Dispositioning Systems
1982	Semiconductor Manufacturing Technology at IBM
1981	Semiconductor Manufacturing in IBM, 1957 to the Present: A Perspective
1980	Registration Mark Detection for Electron-Beam Lithography—EL1 System
1972	Acoustic Signal Analysis for Noise Source Identification in Mechanisms
1972	Design and Fabrication of Heat Transfer Surfaces from Superplastic Material
1972	Detection of Discontinuities in Passivating Layers on Silicon by NaOH Anisotropic Etch
1972	Development of Water-soluble Systems for Use in Industrial Soldering Processes
1972	Holographic Interferometry Deformation Study of a Printer Type-piece
1972	Monitoring Microinch Displacements in Ultrasonic Welding Equipment
1972	Silicon Process Technology for Monolithic Memory
1971	A Design Study of Ultrasonic Bonding Tips
1970	A Transmission Control Unit for High-speed Computer-to-computer Communication
1970	An Integrated Manufacturing Process Control System: Implementation in IBM Manufacturing
1970	Computer-aided Testing and Fabrication of Magnetic Tape Heads
1970	IBM System/7 and Plant Automation
1970	Indium-mercury Alloy as a Low-toxicity Liquid Electrode
1970	Integrated Manufacturing Systems: Architectural Considerations
1970	PCOS: A Process Control Extension to Operating System/360
1970	Precision Automatic Measuring of X-Y Coordinates
1969	A Nonlinear Digital Filter for Industrial Measurements
1969	Dynamic Inventory Models and Stochastic Programming
1969	High Performance Reduction Lenses for Microelectronic Circuit Fabrication
1969	Stochastic Model for Manufacturing Cost Estimating
1967	A Computer-Operated Manufacturing and Test System
1957	Simple Constant-Temperature Oven and Control System