 2001 | Influence of trapped and interfacial charges in organic multilayer light-emitting devices |
| 2001 | Strain measurement and numerical analysis of an epoxy adhesive subjected to thermal loads |
| 1999 | Characterization of silicon surface preparation processes for advanced gate dielectrics |
| 1999 | Growth and characterization of ultrathin nitrided silicon oxide films |
| 1999 | Key measurements of ultrathin gate dielectric reliability and in-line monitoring |
| 1999 | Titanium dioxide (TiO2)-based gate insulators |
| 1999 | Ultrathin nitrided gate dielectrics: Plasma processing, chemical characterization, performance, and reliability |
| 1997 | Development and application of a new tool for lithographic mask evaluation, the stepper equivalent Aerial Image Measurement System, AIMS |
| 1997 | Prefetching and memory system behavior of the SPEC95 benchmark suite |
| 1996 | Computer-aided 3D tolerance analysis of disk drives |
| 1996 | Portable Faraday cup for nonvacuum proton beams |
| 1995 | Design and applications of a scanning SQUID microscope |
| 1995 | Integrated cost and productivity learning in CMOS semiconductor manufacturing |
| 1995 | VLSI on-chip interconnection performance simulations and measurements |
| 1994 | Studies of adhesion by secondary ion mass spectrometry |
| 1990 | Electro-optic sampling of high-speed devices and integrated circuits |
| 1990 | Flexible picosecond probing of integrated circuits with chopped electron beams |
| 1990 | Picosecond noninvasive optical detection of internal electrical signals in flip-chip-mounted silicon integrated circuits |
| 1990 | Picosecond photoelectron microscope for high-speed testing of integrated circuits |
| 1990 | Picosecond photoemission probing of integrated circuits: Capabilities, limitations, and applications |
| 1984 | Bending-cantilever method for the study of moisture swelling in polymers |
| 1984 | Micromechanics of multilayer printed circuit boards |
| 1984 | Print Quality Measurements for High-Speed Electrophotographic Printers |
| 1983 | A Hybrid Optical-Digital Image Processing Method for Surface Inspection |
| 1980 | A Contactless Method for High-Sensitivity Measurement of p-n Junction Leakage |
| 1980 | Interferometric Wavelength Measurements through Post-Detection Signal Processing |
| 1980 | Overlay in Lithography |
| 1980 | The Characteristics of Chip-to-Chip Signal Propagation in a Package Suitable for Superconducting Circuits |
| 1979 | Nondestructive Analysis for HeNe Lasers |
| 1978 | A Phenomenological Study of AC Gas Panels Fabricated with Vacuum-Deposited Dielectric Layers |
| 1978 | An Analytic Model of the VM/370 System |
| 1978 | Characterization of Voltage and Charge Transfer in AC Gas Discharge Displays |
| 1978 | Effect of Reactive Gas Dopants on the MgO Surface in AC Plasma Display Panels |
| 1978 | Electrical and Optical Characteristics of Evaporable-Glass-Dielectric AC Gas Display Panels |
| 1977 | Automatic Registration in an Electron-Beam Lithographic System |
| 1977 | Automatic Signature Verification Based on Accelerometry |
| 1977 | Capacitance Probe Study of Rotating-Head/Tape Interface |
| 1977 | Effect of Parameter Variations on Drop Placement in an Electrostatic Ink Jet Printer |
| 1977 | Experiments on the Dynamic Response of a Flexible Strip to Moving Loads |
| 1977 | Scale Model of an Ink Jet |
| 1977 | Sequential Stopping Rules for the Regenerative Method of Simulation |
| 1977 | Splatter During Ink Jet Printing |
| 1977 | Study of Fluid Flow through Scaled-up Ink Jet Nozzles |
| 1976 | Speckle Pattern Interferometry of Vibration Modes |
| 1975 | Vibrating Reed Internal Friction Apparatus for Films and Foils |
| 1974 | Infrared Laser Interferometer for Measuring Air-bearing Separation |
| 1974 | Investigation into Scheduling for an Interactive Computing System |
| 1974 | On-line Measurement of Paging Behavior by the Multivalued MIN Algorithm |
| 1974 | Photolithography in Integrated Circuit Mask Metrology |
| 1973 | Design and Operation of ETA, an Automated Ellipsometer |
| 1973 | Dimensional Measurement and Defect Detection Using Spatial Filtering |
| 1973 | Interactive Use of a Time-shared Process Control Computer in Electrophotographic Sensitometry |
| 1973 | Rapid, Precise, Computer-controlled Measurement of X-Y Coordinates |
| 1970 | Precision Automatic Measuring of X-Y Coordinates |
| 1968 | On the Measurement of Impurity Atom Distributions in Silicon by the Differential Capacitance Technique |
| 1968 | Reflectivity Thickness Corrections for Silicon Dioxide Films on Silicon for VAMFO |
| 1966 | Design of a Moiré Fringe Torque Transducer |
| 1966 | In-situ Measurements of Magnetic Properties in Vacuum-Deposited Permalloy Films |
| 1966 | New Methods for De Haas–Shubnikov Measurements |
| 1964 | Nondestructive Determination of Thickness and Refractive Index of Transparent Films |
| 1962 | Thermodynamic Consistency of Magnetic and Calorimetric Measurements on Superconductors |
| 1959 | Application of Phase-Contrast Metallography in a Production Laboratory |
