Structure and Magnetic Anisotropy of Amorphous Gd–Co Films
by A. Onton, N. Heiman, J. C. Suits, W. Parrish
It is found that the structure of amorphous Gd–Co films, as revealed by x-ray diffraction, is correlated with the magnitude of bias voltage present during the sputter deposition. Films sputter deposited with zero bias voltage typically show one broad peak in an x-ray diffraction spectrum, and films sputter deposited with −100 volts bias show two broad peaks with a shoulder between them. These structural differences appear to be related to the perpendicular magnetic anisotropy in these films.