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IBM Journal of Research and Development  
Volume 30, Number 4, Page 387 (1986)
Scanning Tunneling Microscopy I
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Tunneling microscopy from 300 to 4.2 K

by S. A. Elrod, A. Bryant, A. L. deLozanne, S. Park, D. Smith, C. F. Quate
A scanning tunneling microscope (STM) has been developed for operation over the full temperature range from 300 to 4.2 K. At room temperature, the instrument has been used to produce topographic images of grain structure in a copper-titanium alloy foil and of atomic structure on a Pt(100) surface. At low temperatures, the instrument can be used in a new spectroscopic mode, one which combines the high spatial resolution of the STM with the existing technique of electron tunneling spectroscopy. This new capability has been demonstrated by using the microscope to probe spatial variations in the superconducting character of a niobium-tin alloy film.
Related Subjects: Films, thin; Scanning tunneling microscopy; Superconductivity; Surface science