A scanning tunneling microscope for surface science studies
by J. E. Demuth, R. J. Hamers, R. M. Tromp, M. E. Welland
A new design is described for a scanning tunneling microscope intended for surface science studies. The performance of the microscope is evaluated from tunneling images obtained of the Si(111) 7×7 surface. Periodic structures, point defects, and grain boundary structures are observed with atomic-scale resolution and are discussed. Illustrations of various types of image processing and data display are presented.