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IBM Journal of Research and Development  
Volume 30, Number 4, Page 396 (1986)
Scanning Tunneling Microscopy I
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A scanning tunneling microscope for surface science studies

by J. E. Demuth, R. J. Hamers, R. M. Tromp, M. E. Welland
A new design is described for a scanning tunneling microscope intended for surface science studies. The performance of the microscope is evaluated from tunneling images obtained of the Si(111) 7×7 surface. Periodic structures, point defects, and grain boundary structures are observed with atomic-scale resolution and are discussed. Illustrations of various types of image processing and data display are presented.
Related Subjects: Image processing; Mechanical design; Scanning tunneling microscopy; Surface science