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IBM Journal of Research and Development  
Volume 28, Number 5, Page 636 (1984)
Design Automation
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Yield model for fault clusters within integrated circuits

by C. H. Stapper
Generalized negative binomial statistics turns out to be a model of the fault distribution in very large chips or wafers with internal defect clusters. This is expected to influence large chip and full wafer redundancy requirements. Furthermore, the yield appears to be affected by an experimental dependence of the average number of faults on chip area.
Related Subjects: Integrated circuits; LSI; Models and modeling