IBM Journal of Research and Development
IBM Skip to main content
  Home     Products & services     Support & downloads     My account  

  Select a country  
Journals Home  
  Systems Journal  
Journal of Research
and Development
    Current Issue  
    Recent Issues  
    Papers in Progress  
    Recent publications  
    Author's Guide  
  Contact Us  
  Related links:  
     IBM Research  

IBM Journal of Research and Development  
Volume 30, Number 5, Page 492 (1986)
Scanning Tunneling Microscopy II
  Full article: arrowPDF   arrowCopyright info


Surface modification with the scanning tunneling microscope

by D. W. Abraham, H. J. Mamin, E. Ganz, J. Clarke
We describe the design and operation of a scanning tunneling microscope (STM) intended for studying surfaces. We are able to prepare samples with ion bombardment and heating, and to characterize them with LEED and Auger analysis in situ before scanning with the STM. Data acquisition and analysis are computer-controlled, with a wide variety of options for presentation. In the near future, we will be able to load-lock samples without venting the UHV chamber. Our STM has very low thermal drift, typically of the order of 1 Å/min. In addition to topographical measurements of the surface, we have obtained spatially resolved maps related to the height of the tunnel barrier. We have investigated the effects of scratching the surface with the tip, and have also succeeded in depositing material from the tip onto the surface. Surface diffusion of material is found to play an important role in both of these processes.
Related Subjects: Films, thin; Materials; Physics, solid state; Remote sensing; Scanning tunneling microscopy; Surface science