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IBM Journal of Research and Development  
Volume 27, Number 3, Page 265 (1983)
Systems Architecture
  Full article: arrowPDF   arrowCopyright info


Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test

by E. B. Eichelberger, E. Lindbloom
Embedded linear feedback shift registers can be used for logic component self-test. The issue of test coverage is addressed by circuit modification, where necessary, of random-pattern-resistant fault nodes. Also given is a procedure that supports net-level diagnosis for structured logic in the presence of random test-pattern generation and signature analysis.
Related Subjects: Built-in self-test (BIST); Logic design and technology; LSSD design and testing; Testing, random-pattern logic