Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test
by E. B. Eichelberger, E. Lindbloom
Embedded linear feedback shift registers can be used for logic component self-test. The issue of test coverage is addressed by circuit modification, where necessary, of random-pattern-resistant fault nodes. Also given is a procedure that supports net-level diagnosis for structured logic in the presence of random test-pattern generation and signature analysis.