IBM Journal of Research and Development
IBM Skip to main content
  Home     Products & services     Support & downloads     My account  

  Select a country  
Journals Home  
  Systems Journal  
Journal of Research
and Development
    Current Issue  
    Recent Issues  
    Papers in Progress  
    Search/Index  
    Orders  
    Description  
    Patents  
    Recent publications  
    Author's Guide  
  Staff  
  Contact Us  
  Related links:  
     IBM Research  

IBM Journal of Research and Development  
Volume 27, Number 6, Page 545 (1983)
Nontopical Issue
  Full article: arrowPDF   arrowCopyright info





   

On Murphy’s Yield Formula

by B. Meister
Some properties of yield are presented, and one lower and three upper bounds for yield are derived. Some of these bounds represent yield formulas already known as useful approximations. Pure Poisson statistics for defect density provides the lower bound. The upper bounds are obtained with mixtures of Poisson distributions and a formula of Price and Stapper.
Related Subjects: Analytical models; Mathematics (applied); Statistics